An Ultrafast X-Ray Detector System at an Elliptically Polarizing Undulator Beamline

Artikel › Journalartikel › 2007

Zitation

Jun Feng; Alberto Comin; Andreas Bartelt; H.-J. Shin; James Nasiatka; Howard Padmore; Anthony Young; Andreas Scholl: An Ultrafast X-Ray Detector System at an Elliptically Polarizing Undulator Beamline. In: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 582. (2007), S. 248-251.

ISSN

74.25.Ha 87.64.Gb

Link

https://www.sciencedirect.com/science/article/pii/S0168900207018153

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