Si/SiO2 multiple quantum wells for all silicon tandem cells: conductivity and photocurrent measurements

Artikel › Journalartikel › 2008

Zitation

Rölver, Robert; Berghoff, Birger; Bätzner, Derk; Spangenberg, Bernd; Kurz, Heinrich; Schmidt, Manfred; Stegemann, Bert: Si/SiO2 multiple quantum wells for all silicon tandem cells: conductivity and photocurrent measurements. In: Thin Solid Films 516. (2008), S. 6793-6766.

ISSN

0040-6090

Link

http://dx.doi.org/10.1016/j.tsf.2007.12.087

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