IPA-free texturization of n-type Si wafers: Correlation of optical, electronic and morphological surface properties

Artikel › Journalartikel › 2013

Zitation

Kegel, Jan; Angermann, Heike; Stürzebecher, Uta; Stegemann, Bert: IPA-free texturization of n-type Si wafers: Correlation of optical, electronic and morphological surface properties. In: Energy Procedia Band 38. (2013), S. 833-842.

ISSN

1876-6102

Link

http://dx.doi.org/10.1016/j.egypro.2013.07.353

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