Quantitative Analysis of Pyramid Textured Silicon Wafers and Size Dependence of Optical and Electronic Properties
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› 2013
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Kegel, Jan; Angermann, Heike; Stürzebecher, Uta; Conrad, Erhard; Stegemann, Bert: Quantitative Analysis of Pyramid Textured Silicon Wafers and Size Dependence of Optical and Electronic Properties. In: Verhandlungen der Deutschen Physikalischen Gesellschaft (DPG) Regensburg. Hg. von DPG. Bad Honnef: 2013, S. 318-319 (Abstract).