Investigation of Laser-fired Rear-side Point Contacts of Laser-crystallized Silicon Thin-film Solar Cells by Conductive Probe Atomic Force Microscopy

Artikel › Journalartikel › 2014

Zitation

Gref, Orman; Sandström, J.; Weizman, Moshe; Rhein, Holger; Gall, Stephan; Schlatmann, Rutger; Boit, C.; Friedrich, Felice: Investigation of Laser-fired Rear-side Point Contacts of Laser-crystallized Silicon Thin-film Solar Cells by Conductive Probe Atomic Force Microscopy. In: Energy Procedia Volume 60 (2014). (2014), S. 76-80.

ISSN

1876-6102

Link

http://dx.doi.org/10.1016/j.egypro.2014.12.345

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