Grazing incidence X-ray fluorescence analysis of buried interfaces in periodically structured crystalline silicon thin-film solar cells
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› 2015
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Eisenhauer, David; Pollakowski, Beatrix; Baumann, Jonas; Preidel, Veit; Amkreutz, Daniel; Rech, Bernd; Back, Franziska; Rudigier-Voigt, Eveline; Beckhoff, Burkhard; Kanngießer, Birgit; Becker, Christiane: Grazing incidence X-ray fluorescence analysis of buried interfaces in periodically structured crystalline silicon thin-film solar cells. In: Physica Status Solidi A Volume 212, Issue 3. (2015), S. 529-534.