Investigation of laser-fired point contacts on KOH structured laser-crystallized silicon by conductive atomic force microscopy

Artikel › Journalartikel › 2016

Zitation

Gref, Orman; Weizman, Moshe; Rhein, Holger; Gabriel, Onno; Gernert, Ulrich; Schlatmann, Rutger; Boit, Christian; Friedrich, Felice: Investigation of laser-fired point contacts on KOH structured laser-crystallized silicon by conductive atomic force microscopy. In: Applied Surface Science Vol. 374, 30.06.2016. (2016), S. 243–247.

ISSN

0169-4332

Link

http:/dx.doi.org/10.1016/j.apsusc.2015.11.186

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