Reduction of the Interface Defect Density on Crystalline Silicon Solar Cell Substrates by Wet-chemical Preparation of Ultrathin SiOx Passivation Layers

Veranstaltungsbeitrag › Vortrag › 2015

Veranstaltung

42nd IEEE Photovoltaic Specialists Conference
New Orleans, 14.06.2015 - 19.06.2015

Ergänzende Angaben

Vortrag von Patrice Balamou, Heike Angermann, Bert Stegemann

Homepage

http://www.ieee-pvsc.org/PVSC42/